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Spotfire Advanced Applications - Semiconductors

This course is a practical analysis program that covers everything from Bin data status analysis to Wafer Defect Map pattern analysis and correlation analysis between yield and process parameters, all based on semiconductor manufacturing data. Going beyond simple visualization, you will learn how to classify defect types using pattern similarity analysis and clustering techniques, and how to interpret the relationship between process variables and yield based on data. The focus is on mastering a structural approach to analyzing semiconductor manufacturing data by directly implementing dashboards that can be utilized in real-world operations.

12 learners are taking this course

Level Intermediate

Course period 3 months

Spotfire
Spotfire
Spotfire
Spotfire

What you will gain after the course

  • Understanding the structure of classifying and analyzing defect patterns based on semiconductor manufacturing data

  • Ability to apply similarity analysis and clustering using Wafer Defect Maps

  • Capability to implement practical dashboards for analyzing the correlation between yield and process parameters

Practical Quality Analysis Based on Semiconductor Manufacturing Data Using Spotfire!

What is Spotfire?📝

Spotfire® is
an in-memory, self-service-based
big data visualization and statistical analysis solution
already being used by various domestic companies.

Goals of this course

This course is a practical program that covers everything from diagnosing manufacturing status to analyzing Wafer Defect Map patterns and investigating the correlation between yield and process parameters based on semiconductor manufacturing data.

Beyond simple visualization, this course aims to develop analytical capabilities to classify defect types using pattern similarity analysis and clustering, and to interpret the relationship between process variables and yield based on data.

Course Features 💡 

✔ Analysis is conducted based on semiconductor manufacturing data structures.
✔ Status diagnosis is performed by combining Bin and Value data.
✔ Covers similarity analysis and K-means clustering based on Wafer Defect Maps.
✔ Implements a dashboard for analyzing the correlation between yield and process variables.
✔ Focused on practical analysis workflows rather than just functional descriptions.

Software Used 🧰

Spotfire®

Frequently Asked Questions Q&A 💬

Q. I am a first-time Spotfire user. Can I still take this course?

This course is designed for users who have basic experience using Spotfire.
Experience with loading data, basic visualization, and using filters and calculated columns is required.
For first-time users, we recommend taking the Spotfire - Basic User Training course before starting this one.

Q. I want to practice using Spotfire; where can I download it?

We provide a 3-month temporary license and installation files for those who have enrolled in the course, which can be used during the enrollment period. After signing up for the course, please apply for the temporary license under the "News" tab.

Q. Where can I download the practice data files used in the lecture?

Sample data files used as course materials can be downloaded from the Section 1 first lecture screen after enrollment.

Q. Can beginners take this course?

This course is designed for intermediate to advanced Spotfire users and is not recommended for those using Spotfire for the first time. If you are not familiar with the Spotfire interface, we recommend taking the Basic and Advanced prerequisite courses first.

Other Information

Please check before taking the course!

  • This course does not provide [Q&A] from the instructor. If you have any inquiries during the course, please check the announcements in the [News] tab.

Recommended for
these people

Who is this course right for?

  • Quality and process personnel performing semiconductor manufacturing data analysis

  • Analysis personnel who want to apply Wafer Defect Map pattern analysis to practical work.

  • An engineer who wants to interpret the correlation between yield and process variables based on data.

  • Users who want to enhance their practical manufacturing data analysis skills using Spotfire.

Need to know before starting?

  • An understanding of Spotfire's basic features is required.

  • We recommend taking this course after completing the Spotfire User Training: Basic Level.

Hello
This is pndsolution

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P&D Solution is a South Korean company specializing in data visualization and analysis. Since introducing Spotfire to the domestic market for the first time in 2003, we have been supporting BI innovation for companies across various industries through proactive problem-solving and execution in a leading environment, based on our experience collaborating with top domestic and international partners.

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Curriculum

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4 lectures ∙ (2hr 3min)

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