Spotfire Advanced Applications - Semiconductors

This course is a practical analysis program that covers everything from Bin data status analysis to Wafer Defect Map pattern analysis and correlation analysis between yield and process parameters, all based on semiconductor manufacturing data. Going beyond simple visualization, you will learn how to classify defect types using pattern similarity analysis and clustering techniques, and how to interpret the relationship between process variables and yield based on data. The focus is on mastering a structural approach to analyzing semiconductor manufacturing data by directly implementing dashboards that can be utilized in real-world operations.