sohomish12297

This course is a practical analysis program that covers everything from Bin data status analysis to Wafer Defect Map pattern analysis and correlation analysis between yield and process parameters, all based on semiconductor manufacturing data.

Going beyond simple visualization, you will learn how to classify defect types using pattern similarity analysis and clustering techniques, and how to interpret the relationship between process variables and yield based on data.

The focus is on mastering a structural approach to analyzing semiconductor manufacturing data by directly implementing dashboards that can be utilized in real-world operations.

pndsolution

Spotfire Advanced Applications - Semiconductors

데이터분석

빅데이터

실무적용

데이터시각화

반도체

입문

초급

중급이상

스팟파이어

Spotfire

Semiconductor Manufacturing Data Analysis Preview

Manufacturing Data Status Diagnosis

Anomaly type analysis based on defect patterns

Yield Impact Factor Analysis